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Dimensional Calibration
Angle Measurement
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Angle | (0 to 360)° | 0.039° |
| Angle Blocks | 0.25° to 60° | 0.0043° |
| Protractors | 0° to 90° | 0.012° |
Depth / Height / Length Measurement
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Thickness Gages | (0.0009 to 0.06) in | 20 μin + 0.035 in/in |
| Calipers | (0 to 12) in (12 to 72) in |
540 μin 980 μin |
| Height/Depth Gages | (0 to 24) in (24 to 72) in |
(21 + 7L) μin 150 μin + 16 μin/in |
| Length Standards | (0 to 18) in |
13 μin + 10 μin/in |
| One Dimensional Length | Up to 12 in (12 to 72) in Up to 300 mm (300 to 1800) mm |
0.0013 in 0.012 in 0.034 mm 0.59 mm |
Diameter / Radius Measurement
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Cylindrical Diameter – Inside | (0.1 to 0.5) in (0.5 to 2.5) in (2.5 to 8) in (8 to 48) in |
26 μin 18 μin + 1.5 μin/in 26 μin + 2 μin/in 250 μin + 2.4 μin/in |
| Cylindrical Diameter – Outside | (0 to 5) in (5 to 18) in (18 to 24) in |
24 μin + 0.43 μin/in 110 μin 290 μin |
| Diameter / Radius | Up to 6 in | 0.00029 in |
Gage Block Measurement
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Gage Block Calibration | (0 to 1) in (2 to 4) in |
3 μin + 0.5 μin/in 2.2 μin + 0.75 μin/in |
Gage Block Comparator – Length |
(0 to 200) μin |
3 μin |
Level Measurement
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Electronic Level Systems | --- | 0.22 arc seconds |
| Levels – Bubble Vial | --- | 0.62R |
Micrometer Calibration
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Bench Micrometers | (0 to 12) in | 17 μin |
| Bore Micrometers | (0.25 to 5) in | 8.5 μin/in + 60 μin |
| Laser Micrometers | Up to 2 in | 32 μin |
| Micrometers | Up to 3 in |
20 μin + 35 μin/in 64 μin + 1.5 μin/in |
| Micrometer Heads | --- | 8.2 μin |
Optical Comparitor Measurement
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Optical Comparator: Angle |
0° to 360° | 0.014° |
| Optical Comparator: Length |
Up to 6 in | 0.00022 in |
| Optical Comparator: Magnification | 10× 20× 31.25× 50× 62.5× 100× |
0.02× 0.014× 0.015× 0.011× 0.012× 0.016× |
| Optical Comparator: Radius / Diameter |
Up to 1 in | 0.0005 in |
Parallel / Squareness Measurement
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Cylindrical Squares – Squareness | (4 to 20) in | 25 μin |
| Parallel Measurements | (0 to 1) in dia Up to 10 in length |
5.7 μin 38 μin |
| Sine Bars – Length Parallelism | (5 to 10) in | 70 μin 38 μin |
Surface Properties Measurement
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Flatness Measurements | (0 to 2) in dia To 10 in length |
4 μin 35 μin |
| Surface Finish Meters – Profilometers | (19 to 122) Ra | 1.8 μin + 0.1 μin/μin |
| Surface Plates – Flatness Repeatability |
Up to 107D in Up to 0.015 in |
(23 + 0.69D) μin 30 μin |
Test Indicator Calibration
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Dial, Digital, and Test Indicators | Resolution: to 10 μin |
6.5 μin |
Thread Plug / Ring / Wire Calibration
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Adjustable Thread Rings – Pitch Diameter Minor Diameter |
(0.25 to 0.5) in (0.25 to 0.5) in |
300 μin 140 μin |
| Thread Plugs – Pitch Diameter Major Diameter |
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| Taper Thread Plug – Pitch Diameter Major Diameter Notch Length |
(0 to 2) in (0 to 2) in (0 to 2) in |
130 μin 90 μin 120 μin |
| Thread Wires – Inch Metric |
(4 to 80) tpi (0.2 to 10) pitch |
27 μin 0.69 μm |
Torque Arm Length Calibration
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Torque Arms | (2 to 24) in (24 to 48) in |
250 μin + 2.4 μin/in 0.00099 in |
Wire Cloth and Sieve Measurement
| Parameter / Equipment | Range | CMC Uncertainty (±) |
| Wire Cloth and Sieves | (0.020 to 12.5) mm | 4.4 μm |
Calibration and Measurement Capability (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment.
Calibration
and Measurement Capabilities represent expanded uncertainties expressed at approximately the 95 %
level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a
specific calibration performed by the laboratory may be greater than the CMC due to the behavior of
the customer’s device and to influences from the circumstances of the specific calibration.
Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.
